| Model | SJ-500P | SJ-500 |
| Order No. | 178-531-02A | 178-533-02A |
| Type of Data processing | PC SYSTEM | Dedicated Data Processor |
| X-axis measuring range | 2in-50mm | 2in-50mm |
| Vertical travel | Optional Stand | Optional Stand |
| Granite base size | Optional Stand | Optional Stand |
| PC unit | 13.7x10.4x3.4in/350x263x86mm | 13.7x10.4x3.4in/350x263x86mm |
| Dimension (main unit) | 16.7x3.7x6.3in 425x94x160mm | 16.7x3.7x6.3in 425x94x160mm |
| Mass main unit | 5.9lbs/2.7kg | 5.9lbs/2.7kg |
| Assessed profiles | Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motif | Dedicated data processor type: P (primary profile), R (roughness profile), WC, envelope residual profile, roughness motif,waviness motif PC system type: P (primary profile), R (roughness profile), WC, WCA, WE, WEA, DIN4776 profile, E (envelope residual profile),roughness motif, waviness motif |
| Evaluation Parameters | Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC, ?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), Customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q, Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW | Dedicated data processor type: Ra, Rc, Ry, Rz, Rq, Rt, Rmax, Rp, Rv, R3z, Sm, S, Pc, mr (c),?c, mr, tp, Htp, Lo, lr, Ppi, HSC, ?a, ?q, Ku, Sk, Rpk, Rvk, Rk, Mr1, Mr2, A1, A2, Vo, ?a, ?q, R, AR, Rx, W, AW, Wx, Wte, (43 parameters), Customization PC system type: Pa, Pq, Psk, Pku, Pp, Pv, Pz, Pt, Pc, PSm, P?q, Pmr (c), Pmr, P?c, Ra, Rq, Rsk, Rku, Rp, Rv, Rz, Rt, Rc, RSm, R?q, Rmr (c), Rmr, R?c, Wa, Wq, Wsk, Wku, Wp, Wv, Wz, Wt, Wc, WSm, W?q, Wmr (c), Wmr, W?c, Rk, Rpk, Rvk, Mr1, Mr2, A1, A2, Rx, AR, R, Wx, AW, W, Wte, Ry, RyDIN, RzDIN, R3y, R3z, S, HSC, Lo, lr, ?a, ?a, ?q, Vo, Htp, NR, NCRX, CPM, SR, SAR, NW, SW, SAW |
| Analysis Graphs | Dedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation graph, slope distribution graph, local peak distribution graph, parameter distribution graph | Dedicated data processor type: ADC, BAC, power spectrum graph PC system type: ADC, BAC Graph, power spectrum graph, auto-correlation graph, Walsh power spectrum graph, Walsh autocorrelation graph, slope distribution graph, local peak distribution graph, parameter distribution graph |
| Curved surface compensation | Dedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation Conic compensation, Inclination (Entire, Arbitrary) PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation, Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensation | Dedicated data processor type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation Conic compensation, Inclination (Entire, Arbitrary) PC system type: Parabolic compensation, Hyperbolic compensation, Elliptical compensation, Circular compensation, Conic compensation, Inclination (Entire, Arbitrary), Polynomial compensation |
| Contour analysis | Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination | Dedicated data processor type: Area, Circle, Angle, Coordinate difference, Step, Inclination PC system type (SURFPAK-EZ): Area, Circle, Angle, Coordinate difference, Step, Inclination |
| Filters | Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-spline | Dedicated data processor type: 2CR-75%, 2CRPC-75%, Gaussian, Robust-spline PC system type: 2CR-75%, 2CR-50%, 2CRPC-75%, 2CRPC-50%, Gaussian, Robust-spline |
Mitutoyo Surface Roughness Tester Surftest- SJ-500/P Series 178
Mitutoyo Surface Roughness Tester Surftest- SJ-500/P Series 178
Mitutoyo Surface Roughness Tester Surftest- SJ-500/P Series 178
FEATURES
High precision and high performance type surface roughness tester with a dedicated control unit, achieving user-friendly display and simple operation
User-friendly display and simple operation equipped with a highly visible color 7.5-inch TFT LCD.
Easy positioning A joy stick built in the dedicated control unit allows easy and quick positioning. Fine positioning of a small stylus, required for measuring the inner side of a small hole, can be easily made using the manual knob.
Easy setting of measuring conditions for surface roughness. Equipped with simple input function allows inputs according to drawing instruction symbols of ISO/JIS roughness standards. Troublesome measuring condition settings can be easily input by directly selecting a drawing instruction symbol for surface roughness from the menu.
Technical Data
X-axis (drive unit)
Measuring range: 1.97" (50mm)
Resolution: 1.97µin(0.05µin)
Measurement method: Linear encoder
Drive speed:0 - 0.78"/s (0 - 20mm/s)
Measuring speed: 0.00078 - 0.2"/s (0.02 - 5mm/s)
Traversing direction: Pull
Traverse linearity: 0.0078µin/1.97" (0.2µin/ 50mm)
Positioning: ±1.5° (tilting, with DAT function)
1.18" (30mm) (up/down)
Detector
resolution / Range: 0.4µin/32000µin, 0.04µin/3200µin,
0.004µin/320µin
0.01µin(800µin), 0.001µin(80µin),
0.0001µin(8µin)
Detecting method: Skidless / skid measurement
Measuring force: 4mN or 0.75mN (low force type)
Stylus tip: Diamond, 90° / 5µin
(60° / 2µin: low force type)
Skid radius of curvature: 1.57" (40mm)
Detecting method: Differential inductance
Control unit
Display: 7.5" color TFT with backlight
Printer: Built-in thermal printer
Magnification: Horizontal: X10 to X500,000, Auto
Vertical: X0.5 to X10,000, Auto
Drive unit control: Joystick operation with manual knob
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